CobaltMaghrebV1, Main, Exploration, bibRecord, 000783

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Identifieur interne : 000783 ( Main/Exploration ); précédent : 000782; suivant : 000784

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Auteurs : A. Kharmouche [Algérie] ; I. Djouada [Algérie]

Source :

Applied surface science [ 0169-4332 ] ; 2008.

RBID : Pascal:08-0446682

Descripteurs français

Pascal (Inist)
- Composition surface, Verre, Couche mince, Evaporation sous vide, Modélisation, RBS, Epaisseur, Simulation, Diffusion mutuelle, Diffusion(transport), Diffraction RX, Réseau hexagonal compact, Orientation préférentielle, Microscopie force atomique, Cobalt alliage, Chrome alliage, Alliage binaire, Alliage CoCr, Silicium, 6855J, 8280Y, 6855N, 6110N.
Wicri :
- topic : Verre, Simulation.

English descriptors

KwdEn :
- Atomic force microscopy, Binary alloys, Chromium alloys, Cobalt alloys, Diffusion, Glass, HCP lattices, Interdiffusion, Modelling, Preferred orientation, RBS, Silicon, Simulation, Surface composition, Thickness, Thin films, Vacuum evaporation, XRD.

Abstract

Series of Co_xCr_1-x thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.

Affiliations:

Algérie

Links toward previous steps (curation, corpus...)

to stream PascalFrancis, to step Corpus: 000123
to stream PascalFrancis, to step Curation: 000172
to stream PascalFrancis, to step Checkpoint: 000125
to stream Main, to step Merge: 000791
to stream Main, to step Curation: 000783

Le document en format XML

<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
</titleStmt>
<publicationStmt><idno type="wicri:source">INIST</idno>
<idno type="inist">08-0446682</idno>
<date when="2008">2008</date>
<idno type="stanalyst">PASCAL 08-0446682 INIST</idno>
<idno type="RBID">Pascal:08-0446682</idno>
<idno type="wicri:Area/PascalFrancis/Corpus">000123</idno>
<idno type="wicri:Area/PascalFrancis/Curation">000172</idno>
<idno type="wicri:Area/PascalFrancis/Checkpoint">000125</idno>
<idno type="wicri:explorRef" wicri:stream="PascalFrancis" wicri:step="Checkpoint">000125</idno>
<idno type="wicri:doubleKey">0169-4332:2008:Kharmouche A:structural:studies:of</idno>
<idno type="wicri:Area/Main/Merge">000791</idno>
<idno type="wicri:Area/Main/Curation">000783</idno>
<idno type="wicri:Area/Main/Exploration">000783</idno>
</publicationStmt>
<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
</analytic>
<series><title level="j" type="main">Applied surface science</title>
<title level="j" type="abbreviated">Appl. surf. sci.</title>
<idno type="ISSN">0169-4332</idno>
<imprint><date when="2008">2008</date>
</imprint>
</series>
</biblStruct>
</sourceDesc>
<seriesStmt><title level="j" type="main">Applied surface science</title>
<title level="j" type="abbreviated">Appl. surf. sci.</title>
<idno type="ISSN">0169-4332</idno>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Atomic force microscopy</term>
<term>Binary alloys</term>
<term>Chromium alloys</term>
<term>Cobalt alloys</term>
<term>Diffusion</term>
<term>Glass</term>
<term>HCP lattices</term>
<term>Interdiffusion</term>
<term>Modelling</term>
<term>Preferred orientation</term>
<term>RBS</term>
<term>Silicon</term>
<term>Simulation</term>
<term>Surface composition</term>
<term>Thickness</term>
<term>Thin films</term>
<term>Vacuum evaporation</term>
<term>XRD</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Composition surface</term>
<term>Verre</term>
<term>Couche mince</term>
<term>Evaporation sous vide</term>
<term>Modélisation</term>
<term>RBS</term>
<term>Epaisseur</term>
<term>Simulation</term>
<term>Diffusion mutuelle</term>
<term>Diffusion(transport)</term>
<term>Diffraction RX</term>
<term>Réseau hexagonal compact</term>
<term>Orientation préférentielle</term>
<term>Microscopie force atomique</term>
<term>Cobalt alliage</term>
<term>Chrome alliage</term>
<term>Alliage binaire</term>
<term>Alliage CoCr</term>
<term>Silicium</term>
<term>6855J</term>
<term>8280Y</term>
<term>6855N</term>
<term>6110N</term>
</keywords>
<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Verre</term>
<term>Simulation</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
 thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</div>
</front>
</TEI>
<affiliations><list><country><li>Algérie</li>
</country>
</list>
<tree><country name="Algérie"><noRegion><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
</noRegion>
<name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
</country>
</tree>
</affiliations>
</record>

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=$WICRI_ROOT/Wicri/Terre/explor/CobaltMaghrebV1/Data/Main/Exploration

HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000783 | SxmlIndent | more

HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 000783 | SxmlIndent | more

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=    Wicri/Terre
   |area=    CobaltMaghrebV1
   |flux=    Main
   |étape=   Exploration
   |type=    RBID
   |clé=     Pascal:08-0446682
   |texte=   Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films
}}

This area was generated with Dilib version V0.6.32.
Data generation: Tue Nov 14 12:56:51 2017. Site generation: Mon Feb 12 07:59:49 2024

	Serveur d'exploration sur le cobalt au Maghreb
	Attention, ce site est en cours de développement ! Attention, site généré par des moyens informatiques à partir de corpus bruts. Les informations ne sont donc pas validées.

Serveur d'exploration sur le cobalt au Maghreb

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Source :

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri